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Advanced Instrument Diagnostics

CEMView is designed with diagnostics in mind...

CEMView takes advantage of the direct communication interface with the analysis instrument to bring advanced instrument diagnostics to the CEM DAS.  With CEMView, it is possible to have a comprehensive CEM system that includes complete software control, configuration parameterization and diagnostics for every analysis instrument of the CEM system.

There is no limit to amount of diagnostic information from an instrument which can be made available in CEMView. Because CEMView interfaces to the analyzer using an instrument specific OPC Server, complete instrument data and status information can be acquired using the communication link.  The information can be made available in CEMView itself, to optional CEMView add-on diagnostic, configuration and parameterization software or to any other OPC Client software application via the OPC Data Access and OPC Alarm and Events specification interfaces of the OPC Server.

Context sensitive on-line help is a natural extension of the diagnostic information acquired from the instrument.  CEMView allows the user to link the diagnostic status flags to the instrument's electronic user manual, on-line help files, Adobe Acrobat pdf files or even a URL hyperlink to an intranet or internet web server.

For the Sick Maihak products, the Sick MEPA configuration application products can be added seamlessly to the CEMView system to function as an integral part of the CEMView application.

Ask us about an on-line demo to see just what is possible with CEMView.

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